The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Feb. 23, 2021
Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventors:

John Charles Ould, Backwell, GB;

Rose Crossland, Bristol, GB;

Assignee:

RENISHAW PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 (2006.01); G01B 5/00 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 5/201 (2013.01); G01B 5/003 (2013.01); G01B 21/045 (2013.01);
Abstract

A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, and the positioning apparatus relatively moving the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature. The method further includes using the first and second sets of data points to determine a form measurement for the artefact.


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