The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jun. 21, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Vijayakumar Ashok Dibbad, Bangalore, IN;

Jeffrey Gemar, San Diego, CA (US);

Shree Krishna Pandey, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 50/02 (2012.01); B60W 50/035 (2012.01); B60W 50/14 (2020.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); B60W 50/035 (2013.01); B60W 50/14 (2013.01); B60W 2050/143 (2013.01); B60W 2050/146 (2013.01);
Abstract

Degradation of a power delivery network (PDN) in a computing device may be detected as part of a self-test during booting of the computing device or a device subsystem. The computing device may be an automotive vehicle control system. A clock signal provided to logic circuitry supplied by the PDN may be modulated, and the modulation frequency may be varied over a range. Voltage droop values in the logic circuitry may be measured in response to the modulation frequencies over the range. Impedance values may be determined by determining an odd harmonic of each of the voltage droop values. The impedance values may be compared with thresholds, and an alert or other indication may be issued if one or more of the impedance values exceeds a threshold.


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