The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Dec. 01, 2021
Hitachi Astemo, Ltd., Hitachinaka, JP;
HITACHI ASTEMO, LTD., Ibaraki, JP;
Abstract
An inspection route generation device generates an inspection route of an external appearance inspection device which performs external appearance inspection on an inspection target based on an image imaged by an imaging unit, and includes: a storage unit which stores inspection position information indicating a plurality of inspection positions at which the imaging unit images the inspection target, and inspection device configuration information indicating a configuration of the external appearance inspection device; and a route determination unit which calculates a route length between respective inspection positions, and a posture change amount of the imaging unit at a time when the imaging unit moves through the plurality of inspection positions, based on the inspection position information and the inspection device configuration information, and determines the inspection route based on the calculated route length and posture change amount.