The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Aug. 29, 2022
Applicant:

Daihen Corporation, Osaka, JP;

Inventor:

Makoto Ikeguchi, Osaka, JP;

Assignee:

DAIHEN Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/00 (2006.01); B25J 9/16 (2006.01); G06T 7/70 (2017.01); G06T 15/00 (2011.01); H04N 13/207 (2018.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); B25J 9/1697 (2013.01); G06T 7/70 (2017.01); G06T 15/00 (2013.01); H04N 13/207 (2018.05); G06T 2200/04 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Provided is a marker detection apparatus able to easily detect the position of a marker and a robot teaching system using the same. A marker detection apparatus includes: a three-dimensional plane detection unit that detects a three-dimensional plane serving as a plane in a three-dimensional space on a basis of point group data acquired by a 3D camera; a two-dimensional plane image generation unit that projects point group data constituting the detected three-dimensional plane in a perpendicular direction based on the three-dimensional plane, thereby generating a two-dimensional plane image; a marker detection unit that detects a marker from the generated two-dimensional plane image; and a marker position calculation unit that, for the detected marker included in the two-dimensional plane image, calculates three-dimensional coordinates on the three-dimensional plane.


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