The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Mar. 27, 2023
Applicant:

Utopiacompression Corporation, Los Angeles, CA (US);

Inventors:

Priya Ganapathy, West Sacramento, CA (US);

Lakshmi Priya Rangaraju, Los Angeles, CA (US);

Jacob Yadegar, Los Angeles, CA (US);

Assignee:

UtopiaCompression Corporation, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/085 (2013.01); A61B 8/4494 (2013.01); A61B 8/485 (2013.01); A61B 8/5246 (2013.01); A61B 8/5269 (2013.01);
Abstract

The present disclosure describes a unique method and system for combining 3D ONS modeling with an elastography measurement (shear wave pulse measurement at a fixed depth) to capture strain values within the ONS wall tissue giving a more reliable assessment of both prior and current TBI, preferably without maneuvers to artificially increase intracranial pressure (ICP). Imaging for the 3D modeling and the elastography utilizes he same H-transducer to obtain B-Mode and shear wave pulse images. The combined data is used in a discriminatory Machine Learning system to provide a discriminatory outcome of TBI.


Find Patent Forward Citations

Ganapathy, Priya. (2025). Systems and methods for detection of traumatic brain injury using combined 3d computational modeling and elastography (U.S. Patent No. 12507981). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12507981

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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