The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jul. 18, 2023
Applicant:

GE Precision Healthcare Llc, Waukesha, WI (US);

Inventors:

Arka Datta, Pewaukee, WI (US);

John Moore Boudry, Waukesha, WI (US);

Ryan James Lemminger, New Berlin, WI (US);

Daniel Joseph Grieshop, Wauwatosa, WI (US);

Roy-Arnulf Helge Nilsen, Waukesha, WI (US);

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/40 (2024.01); A61B 6/03 (2006.01); A61B 6/58 (2024.01);
U.S. Cl.
CPC ...
A61B 6/4021 (2013.01); A61B 6/032 (2013.01); A61B 6/583 (2013.01);
Abstract

A system and a method for maintaining an X-ray focal spot position at a desired location on an X-ray detector of an X-ray imaging system include obtaining, via processing circuitry, a scan protocol for performing an X-ray scan with the X-ray imaging system. The system and the method also include determining, via the processing circuitry, a bending magnet current value to utilize to maintain the X-ray focal spot position of an X-ray beam emitted from an X-ray tube of the X-ray imaging system at the desired location on the X-ray detector based on a plurality of acquisition parameters of the X-ray scan. The system and the method further include utilizing, via the processing circuitry, the bending magnet current value during the X-ray scan to maintain the X-ray focal spot position at the desired location on the X-ray detector.


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