The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Apr. 24, 2023
Applicant:
Pamtek Co., Ltd., Hwaseong-si, KR;
Inventors:
Jae Woong Kim, Hwaseong-si, KR;
Jung In Park, Hwaseong-si, KR;
Jun Young Yeom, Suwon-si, KR;
Jeong Heo, Hwaseong-si, KR;
Je Hee Ryu, Seocheon-gun, KR;
Assignee:
PAMTEK Co., Ltd., Hwaseong-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10D 84/01 (2025.01); H01L 21/304 (2006.01); H01L 21/68 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
H10D 84/01 (2025.01); H01L 21/3043 (2013.01); H01L 21/68 (2013.01); H01L 21/6836 (2013.01); H01L 21/6838 (2013.01);
Abstract
A semiconductor wafer sample pre-processing system improves productivity and process reliability by automating all process from cutting a into a plurality of wafer samples through polishing of the wafer samples.
Kim, Jae. (2025). Automated semiconductor wafer sample pre-processing system (U.S. Patent No. 12507463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12507463
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile