The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Mar. 31, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Prashant Sharma, San Jose, CA (US);

Ahmed Elshafie, San Diego, CA (US);

Changhwan Park, San Diego, CA (US);

Yuchul Kim, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 56/00 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 56/0015 (2013.01); H04W 24/10 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. A user equipment (UE) may perform measurements on one or more synchronization signals using a low power wake-up radio (WUR) of the UE. For example, the UE may receive first control information associated with a low power synchronization signal. In some examples, the first control information may include a periodicity of the low power synchronization signal and an indication of which measurements to perform on the low power synchronization signals. Based on the first control information, the UE may monitor, using the low power WUR, a resource occasion for the low power synchronization signal. Based on monitoring and receiving the low power synchronization signals, the UE may perform, using the low power WUR, the measurements of the low power synchronization signal. The UE may transmit a report including the measurements of the low power synchronization signal based on performing the measurements.


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