The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Sep. 06, 2024
Dell Products L.p., Round Rock, TX (US);
Jeebak Mitra, Ottawa, CA;
Gwenael Poitau, Montreal, CA;
DELL PRODUCTS L.P., Round Rock, TX (US);
Abstract
Use of a data-driven approach that assimilates historical signal to interference-plus noise ratio (SINR) and channel estimation data along with location-map of the cell in which base station equipment is situated to better define the relationship between SINR and the user-channel environmental map and spatio-temporal changes to it to achieve more granular, cell site-specific modeling is disclosed herein. This data-driven approach estimates SINR using variational autoencoders. Variational encoders typically consist of two sections, an encoder section and decoder section. The encoder section learns the distribution on the low-dimensional latent space over the input data samples. The decoder section is a generative model that learns the joint distribution of the latent variables and input data.