The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jul. 18, 2022
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Nils Bruenggel, Muri, CH;

Patrick Conway, Cham, CH;

Pascal Vallotton, Buchs, CH;

Assignee:

ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G16H 30/40 (2018.01); G06T 5/50 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20212 (2013.01);
Abstract

A computer-implemented method of generating training data to be used to train a machine learning model for generating a segmentation mask of an image containing overlapping particles. Training data is generated from sparse particle images which contain no overlaps. Generating masks for non-overlapping particles is generally not a problem if the particles can be identified clearly; in many cases simple methods such as thresholding already yield usable masks. The sparse images can then be combined to images which contain artificial overlaps. The same can be done for the masks as well which yields a large amount of training data, because of the many combinations which can be created from just a small set of images. The method is simple yet effective and can be adapted to many domains for example by adding style-transfer to the generated images or by including additional augmentation steps.


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