The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Dec. 22, 2021
Applicant:

Deere & Company, Moline, IL (US);

Inventor:

Daniel Ribeiro Silva, San Jose, CA (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/10 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06V 20/188 (2022.01); G06V 10/764 (2022.01);
Abstract

Implementations are described herein for reducing the time and costs associated with the collection and processing of information for observing and evaluating crop growth. In various implementations, a temporal sequence of images depicting a growth of a crop over a time interval may be processed using a machine learning model. Based on the processing, a crop trajectory of image embeddings may be generated that represent the growth of the crop over the time interval. The crop trajectory of image embeddings may be compared with one or more reference crop trajectories of image embeddings. Each of the one or more reference crop trajectories may include a plurality of image embeddings that represent growth of the same type of crop as the crop trajectory of image embeddings over a respective time interval. Data associated with the comparing may be provided as output.


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