The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jan. 11, 2024
Applicants:

Sony Group Corporation, Tokyo, JP;

Sony Corporation of America, New York, NY (US);

Inventors:

Chen Fu, San Jose, CA (US);

Mohammad Gharavi Alkhansari, San Jose, CA (US);

Assignees:

Sony Corporation of America, New York, NY (US);

SONY GROUP CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01); G06T 15/50 (2011.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01); G06T 15/506 (2013.01); G06T 17/20 (2013.01);
Abstract

An electronic apparatus and method for generation of subsurface scattering texture maps for three-dimensional (3D) objects is provided. The electronic apparatus controls a set of light sources to generate a set of lighting patterns. The electronic apparatus controls a set of image capture devices to capture a set of images of an object that is illuminated by the generated set of lighting patterns. The electronic apparatus determines pixel-level offset information based on application of an image registration operation on the set of images. The electronic apparatus generates a set of corrected images based on the pixel-level offset information and the set of images. The electronic apparatus estimates subsurface scattering (SSS) parameters in a form of texture maps corresponding to a 3D mesh of the object. The estimation is performed based on a fitting of a scattering model on the set of corrected images.


Find Patent Forward Citations

Loading…