The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Feb. 11, 2025
Insitro, Inc., South San Francisco, CA (US);
Daphne Koller, Portola Valley, CA (US);
Ajamete Kaykas, San Francisco, CA (US);
Eilon Sharon, Menlo Park, CA (US);
Cecilia Giovanna Silvia Cotta-Ramusino, Cambridge, MA (US);
Peter Franklin Palmedo, Jr., San Francisco, CA (US);
Mohammad Muneeb Sultan, San Francisco, CA (US);
Panagiotis Dimitrios Stanitsas, Palo Alto, CA (US);
Francesco Paolo Casale, San Francisco, CA (US);
Adam Joseph Riesselman, Brisbane, CA (US);
Lorn Kategaya, Oakland, CA (US);
Max R. Salick, South San Francisco, CA (US);
Insitro, Inc., South San Francisco, CA (US);
Abstract
Embodiments of the disclosure include systems and non-transitory computer readable media for analyzing microscopy images for developing machine learning models for disease modeling. Microscopy images are captured from cells of one or more exposure response phenotypes (ERPs) and further used to train machine learning models. Thus, trained machine learning models can distinguish between microscopy images captured from healthy and diseased samples.