The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jun. 09, 2022
Siemens Healthineers Ag, Forchheim, DE;
Halid Yerebakan, Carmel, IN (US);
Gerardo Hermosillo Valadez, West Chester, PA (US);
Yoshihisa Shinagawa, Downingtown, PA (US);
Matthias Wolf, Coatesville, PA (US);
Anna Jerebko, Lexington, MA (US);
Yu Zhao, West Chester, PA (US);
Simon Allen-Raffl, West Chester, PA (US);
Katharina Schmidler Burk, Cedar City, UT (US);
Mahesh Ranganath, Malvern, PA (US);
Siemens Healthineers AG, Forchheim, DE;
Abstract
A computer implemented method and apparatus for determining a location at which a given feature is represented in medical imaging data is disclosed. A first descriptor for a first location in first medical imaging data is obtained. The first location is the location within the first medical imaging data at which the given feature is represented. A second descriptor for each of a plurality of candidate second locations in second medical imaging data is obtained. A similarity metric indicating a degree of similarity with the first descriptor is calculated for each of the plurality of candidate second locations. A candidate second location is selected from among the plurality of candidate second locations based on the calculated similarity metrics. The location at which the given feature is represented in the second medical imaging data is determined based on the selected candidate second location.