The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Feb. 11, 2025
Applicant:

The Huntington National Bank, Columbus, OH (US);

Inventors:

Robert Carnell, Columbus, OH (US);

Daniel R. Tuthill, Columbus, OH (US);

Jingyu Song, Columbus, OH (US);

Xuelei Yuan, Columbus, OH (US);

Assignee:

The Huntington National Bank, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

Techniques are described herein for verifying and/or reducing bias in machine learning (ML) models. An ML model may be trained using a baseline training data set (TDS). A second TDS may be generated from the baseline TDS based on executing a classification algorithm to assign each example to one of a set of classes. The class-aware ML models may be trained using class-specific examples (e.g., examples that correspond to a given class). Bias in the ML model may be detected based on providing an input to the ML model and each of the class-aware ML models and identifying differences between their respective outputs. If bias is detected, a parameter that highly correlates to the output of the ML model may be removed from the training data and the process may begin anew. Each iteration of the process may reduce the bias originally detected in the ML model.


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