The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Aug. 25, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Bernie Hu, Chengdu, CN;

Shuang Zheng, Chengdu, CN;

Ellie Jiang, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01);
Abstract

Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting a regression test case from a plurality of regression test cases in a software testing lifecycle system. A test selection system calculates a score for the regression test case using an Analytic Hierarchy Process (AHP) assigned weight. Using the score, the test selection system visualizes a relationship between the regression test case and goals associated with a regression testing effort. The test selection system selects the regression test case for use in the regression testing effort based on the visualized relationship, and executes the regression test case on a system.


Find Patent Forward Citations

Loading…