The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Feb. 27, 2024
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Shutaro Takeda, Tokyo, JP;

Assignee:

HITACHI VANTARA, LTD., Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/42 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3485 (2013.01);
Abstract

There is provided a load verification system that performs load performance verification of a data storage area. The load verification system includes: a verification-purposed performance metrics collector that acquires performance metrics of the data storage area and a volume thereof that are load verification targets; an expected performance metrics data generator that generates performance metrics data that will be a result of a load, expected with respect to the load-verification-target volume; and an I/O pattern data generator that generates input/output pattern data based on which a load is generated that causes generation of performance metrics data whose performance is equivalent to expected performance indicated in the expected performance metrics data. An input/output pattern is reproduced by a reproduction section based on the data generated by the I/O pattern data generator, and performance metrics generated as a result of applying a load to the load-verification-target volume are collected.


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