The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Dec. 16, 2022
Dell Products L.p., Round Rock, TX (US);
Ray Guangliang Lei, Shanghai, CN;
Kay Shan, Shanghai, CN;
Ying Zhang, Shanghai, CN;
Xinquan Fu, Shanghai, CN;
Chun XI Kenny Chen, Shanghai, CN;
DELL PRODUCTS L.P., Round Rock, TX (US);
Abstract
System testing is described. An example system testing method includes: acquiring module relationship information for a system under test, the system under test including a plurality of modules, the module relationship information indicating a logical relationship between each two of the plurality of modules; and testing at least two modules in the system under test based on the module relationship information, the at least two modules being associated with each other for the same function implemented by the system under test. By use of the technical solution of the present disclosure, both system and module perspectives can be applied to system integration testing, so as to achieve a more comprehensive system testing coverage and find problems in the system under test as soon as possible, which can help to improve the system testing coverage and system testing efficiency.