The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Aug. 30, 2021
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Yoshiyuki Nagata, Yokohama, JP;
Hirofumi Ohara, Yokohama, JP;
Tomoyuki Kojima, Yokohama, JP;
Susumu Sekine, Yokohama, JP;
Daiki Fujimura, Yokohama, JP;
Toshishige AI, Yokohama, JP;
Manabu Saito, Yokohama, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
Provided is an abnormality response teaching system that estimates a factor of an abnormality and teaches a treatment for the factor. This abnormality response teaching system is provided with: an operation parameter acquisition unit for acquiring an operation parameter measured during operation of a device; a diagnosis information acquisition unit for acquiring diagnosis information indicating the result of a diagnosis of operation of a machine with which the device is provided, said diagnosis being executed prior to startup of the device; and a factor analysis unit for inputting the operation parameter and the diagnosis information to an FTA with which abnormality factors are analyzed, and thereby analyzing an abnormality factor, when an abnormality occurs in the device.