The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Feb. 08, 2023
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Ryogo Hishikawa, Tokyo, JP;
Toshifumi Kanno, Tokyo, JP;
Ryutaro Fujisawa, Tokyo, JP;
Shuji Tanigawa, Tokyo, JP;
Masayuki Ota, Tokyo, JP;
Shintaro Kimura, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An arithmetic device includes a deformation amount acquisition unit that acquires an actual measurement deformation amount of a fabrication object that is manufactured based on a target shape, the actual measurement deformation amount corresponding to a deviation amount of a shape of the fabrication object from the target shape, an analysis unit that performs an analysis, based on the target shape of the fabrication object and a reference inherent strain value corresponding to a reference value of an inherent strain of the fabrication object, and acquires an analytical deformation amount corresponding to a deviation amount of the shape of the fabrication object in the analysis from the target shape, and a strain calculation unit that calculates an estimated inherent strain value corresponding to an estimated value of the inherent strain of the fabrication object with the target shape, based on the actual measurement deformation amount and the analytical deformation amount.