The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jun. 21, 2022
Applicant:

Trumpf Werkzeugmaschinen SE + Co. KG, Ditzingen, DE;

Inventors:

Jens Ottnad, Karlsruhe, DE;

Leonie Felica Tatzel, Korntal, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/41 (2006.01); G05B 19/4155 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4155 (2013.01); G05B 2219/45041 (2013.01);
Abstract

A method for determining cutting parameters for a laser cutting machine includes the following steps: Receiving at least one machine parameter, at least one process parameter and/or at least one material parameter; outputting properties that can be influenced by the cutting parameters, of a laser-cut edge to be cut by the laser cutting machine; receiving a weighting of the properties; and determining the cutting parameters using the at least one machine parameter, the at least one process parameter, and/or the at least one material parameter and also using the weighted properties. There is also described an apparatus for carrying out the method, in particular an apparatus for machining a workpiece and/or an apparatus which is designed to simulate a production process.


Find Patent Forward Citations

Ottnad, Jens. (2025). Method and apparatus for determining cutting parameters for a laser cutting machine (U.S. Patent No. 12504740). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12504740

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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