The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

May. 21, 2020
Applicant:

Peridot Print Llc, Palo Alto, CA (US);

Inventors:

Salvador Sanchez Ribes, Sant Cugat del Valles, ES;

Jason C. Hower, Corvallis, OR (US);

Jeremy Harlan Donaldson, Corvallis, OR (US);

Sergio Puigardeu Aramendia, Sant Cugat del Valles, ES;

Marc Garcia Grau, Sant Cugat del Valles, ES;

Assignee:

Peridot Print LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4099 (2006.01); B29C 64/165 (2017.01); B29C 64/393 (2017.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B29C 64/393 (2017.08); B33Y 50/02 (2014.12); B29C 64/165 (2017.08); G05B 2219/49023 (2013.01);
Abstract

A method comprising dividing a build model comprising an object model arranged within a virtual volume into cross-sectional layers along a vertical axis. The layers represent layers of an additive manufacturing process. A set of base layers is identified with each of the base layers comprising a flat bottom surface of the object model. A base characteristic is assigned to the set of base layers. A set of bulk layers is identified which excludes the set of base layers. A bulk characteristic is assigned to the set of bulk layers. An additive manufacturing apparatus is instructed to build a build cake according to the build model, layers and assigned characteristics, so a fluid agent is deposited at a first rate for the set of bulk layers having the bulk characteristic and a second rate, slower than the first rate, for the set of base layers having the base characteristic.


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