The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Nov. 28, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Sidharth Bhatia, Santa Cruz, CA (US);

Roger Lindley, Santa Clara, CA (US);

Upendra Ummethala, Cupertino, CA (US);

Thomas Li, Santa Clara, CA (US);

Michael Howells, San Jose, CA (US);

Steven Babayan, Los Altos, CA (US);

Mimi-Diemmy Dao, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
G05B 13/027 (2013.01); G05B 13/048 (2013.01);
Abstract

A method includes providing, as input to a first trained machine learning model, trace data associated with one or more substrate processing procedures. The input further includes equipment constants associated with the one or more substrate processing procedures. The input further includes trace data of a first processing chamber. The input further includes equipment constants of the first processing chamber. The method further includes obtaining, as output from the first trained machine learning model, a recommended update to a first equipment constant of the first processing chamber. The method further includes updated the first equipment constant of the first processing chamber responsive to obtaining the output from the first trained machine learning model.


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