The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jul. 18, 2022
Applicant:
Nikon-essilor Co., Ltd., Tokyo, JP;
Inventor:
Sungjin Cho, Kawasaki, JP;
Assignee:
NIKON-ESSILOR CO., LTD., Tokyo, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G02C 7/027 (2013.01); G02C 7/028 (2013.01); G02C 7/061 (2013.01);
Abstract
A sensitivity evaluation method includes: causing a wearer to view a target through a lens or a lens group capable of controlling at least one optical property among a spherical power, a cylindrical power, and an astigmatic axis angle; and acquiring information about a sensitivity of the wearer with respect to an aberration.
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Cho, Sungjin. (2025). Sensitivity evaluation method, ophthalmic lens design method, ophthalmic lens manufacturing method, ophthalmic lens, ophthalmic lens ordering device, ophthalmic lens order receiving device, and ophthalmic lens order receiving/ordering system (U.S. Patent No. 12504647). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12504647
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile