The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Apr. 12, 2021
Universität Zürich, Zürich, CH;
Fabian Friedrich Voigt, Zürich, CH;
Fritjof Helmchen, Zürich, CH;
UNIVERSITAT ZURICH, ZURICH, CH;
Abstract
The present invention relates to an immersion microscope objective () for inspecting a sample (S) in an immersion medium (M), comprising: at least one concave minor (), at least one optical element () comprising an aspherical surface () facing the at least one concave minor (), and an internal space () arranged between the at least one concave minor () and said aspherical surface (), said internal space () being configured to be filled with an immersion medium (M) such that the immersion medium (M) contacts the at least one concave minor () and the aspherical surface (). According to the present invention, the aspherical interface () is shaped such that the working distance () of the immersion microscope objective () varies by less than 1% when the refractive index n of said immersion medium (M) is increased or decreased by at least 0.025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile