The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Mar. 18, 2020
Fanuc Corporation, Yamanashi, JP;
I Peace, Inc., Palo Alto, CA (US);
Kazunori Ban, Yamanashi, JP;
Satoshi Kinoshita, Yamanashi, JP;
Koji Tanabe, Kyoto, JP;
Ryoji Hiraide, Kyoto, JP;
FANUC CORPORATION, Yamanashi, JP;
I PEACE, INC., Palo Alto, CA (US);
Abstract
A microscope observation system comprises a cell production device provided with a culture vessel in which cells or cell masses are cultured, a microscope device capable of observing an object including cells or cell masses, a conveying apparatus that conveys the microscope device to the cell production device, and an operating control section that sends a command to the conveying apparatus to temporarily move the conveying apparatus from a current position to a relay position and then to move the conveying apparatus to a target position when focusing the microscope device onto the object, wherein a first distance from the current position to the relay position is a distance necessary to drive an actuator by at least a predetermined amount in order to actuate a rotation shaft or a translation shaft of the conveying apparatus, and a second distance from the current position to the target position is a shorter distance than the first distance.