The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Dec. 15, 2021
3m Innovative Properties Company, St. Paul, MN (US);
Martin B. Wolk, Woodbury, MN (US);
Robert L. Brott, Woodbury, MN (US);
Kevin W. Gotrik, Hudson, WI (US);
Christopher S. Lyons, St. Paul, MN (US);
Caleb T. Nelson, McKinney, TX (US);
Vadim Savvateev, St. Paul, MN (US);
James M. Nelson, Lino Lakes, MN (US);
Craig R. Schardt, Woodbury, MN (US);
Jeffrey L. Solomon, Centerville, MN (US);
Karl K. Stensvad, Eagan, MN (US);
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Abstract
An optical article includes a waveguide and a structured film. The structured film includes a polymeric substrate, an etch stop layer disposed on the polymeric substrate, a structured layer including a plurality of engineered structures disposed on a side of the etch stop layer opposite the polymeric substrate, a planarizing backfill layer disposed over the plurality of engineered structures to define a substantially planar major surface of the planarizing backfill layer having a surface roughness Ra, and an adhesive layer disposed on the substantially planar surface of the planarizing backfill layer and bonding the structured film to the waveguide. A difference in index of refraction of the planarizing backfill layer and the structured layer is at least 0.25 for at least a first wavelength Win a range of 400 nm to 2500 nm. The adhesive layer has an average thickness ta where Ra<ta<¼W