The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Feb. 26, 2024
Novatel Inc., Calgary, CA;
Graeme Garner, Calgary, CA;
NovAtel Inc., Calgary, CA;
Abstract
An overbound distribution is calculated from a base mixture distribution. For a bounded region, the base distribution is lower-bound at an evaluation point with a second-order polynomial of the base distribution and upper-bound at the evaluation point with a first-order polynomial of a single distribution with a standard deviation value calculated from the base distribution. If the step size from the evaluation point to an intersection of the lower and upper bounds is less than a threshold, the standard deviation value can be iteratively increased until the step size exceeds the threshold. The process is performed for additional portions of the base distribution up to a critical value to determine a final adjusted standard deviation value for the single distribution that is tightly bound to the base distribution and that can be used by a solution algorithm to determine a solution (used to seed filter states for a navigation filter).