The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jun. 18, 2021
Applicant:

Universiteit Leiden, EZ Leiden, NL;

Inventors:

Amy C. Harms, Leiden, NL;

Thomas Hankemeier, Leiden, NL;

Tom Van Der Laan, Leiden, NL;

Assignee:

UNIVERSITEIT LEIDEN, Leiden, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/46 (2006.01); B01D 15/12 (2006.01); B01D 15/18 (2006.01); B01D 15/32 (2006.01); B01D 15/36 (2006.01); B01D 15/38 (2006.01); G01N 30/08 (2006.01);
U.S. Cl.
CPC ...
G01N 30/468 (2013.01); B01D 15/125 (2013.01); B01D 15/1871 (2013.01); B01D 15/325 (2013.01); B01D 15/362 (2013.01); B01D 15/363 (2013.01); B01D 15/3847 (2013.01); G01N 30/08 (2013.01); G01N 2030/085 (2013.01);
Abstract

A chromatography analysis apparatus () comprises: a fractionation device () for receiving a sample, the fractionation device () defining a sample flow path that includes a guard column; and a fractionation output analyser (), wherein a fractionation output of the guard column is provided to an input of the fractionation output analyser () for enabling subsequent analysis of the fractionation output by the fractionation output analyser ().


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