The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Aug. 11, 2023
The Texas A&m University System, College Station, TX (US);
Junhwi Bak, College Station, TX (US);
Yue Wu, Mission Viejo, CA (US);
Richard Bryant Miles, Bryan, TX (US);
Christopher M. Limbach, Ann Arbor, MI (US);
The Texas A&M University System, College Station, TX (US);
Abstract
A system for measurement of light scattering from a test article includes a light emitting device, configured to emit a light beam onto the test article along light axis, a collection assembly configured to collect scattered light from the test article along a measurement axis that is oriented at a non-zero angle from the light axis, wherein the collection assembly includes a first angular spectral filter, and a second angular spectral filter spaced from the first angular spectral filter along the measurement axis, wherein a position or orientation of at least one of the first angular spectral filter and the second angular spectral is adjustable relative to the measurement axis.