The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

May. 09, 2022
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

Adrian Charles Riddick, Medfield, MA (US);

Michael Ashman, Natick, MA (US);

Wilson Villegas, Greenville, RI (US);

Martin Allen Peterson, Wrentham, MA (US);

Eric Stuebe, Needham, MA (US);

Richard Balcarek, South Easton, MA (US);

Assignee:

Illinois Tool Works Inc., Glenview, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/06 (2006.01); G01N 3/62 (2006.01);
U.S. Cl.
CPC ...
G01N 3/068 (2013.01); G01N 3/62 (2013.01); G01N 2203/0647 (2013.01); G01N 2203/0682 (2013.01);
Abstract

Systems and methods for materials testing include mage devices employing camera based image capture (e.g., vision or video) for measurement of strain on the test specimen. Such systems and methods collect multiple images of the specimen under test (i.e. during a testing process), with the images being synchronized with other signals of interest for the test (such as specimen load, machine actuator and/or crosshead displacement, etc.). The images of the specimen are analyzed (e.g., in real-time and/or post-test) by algorithms to locate and track specific specimen characteristics as the test progresses.


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