The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Dec. 24, 2021
Fukuda Co., Ltd., Tokyo, JP;
Mao Hirata, Tokyo, JP;
Akimitsu Tanabe, Tokyo, JP;
FUKUDA CO., LTD., Tokyo, JP;
Abstract
A leak test condition design method includes obtaining an internal volume of a test piece and a remaining internal volume of a test piece capsule with the test piece loaded for a differential pressure based air leak test; determining a test air pressure to be applied into the test piece capsule when the differential pressure based air leak test is performed; determining bombing conditions of a helium leak test; obtaining a differential pressure value between a test piece and a master to be gained when the differential pressure based air leak test is performed and converting into an equivalent standard leak rate to derive a differential pressure conversion value; obtaining a helium leak rate of the test piece gained and converting into an equivalent standard leak rate to derive a helium leak rate conversion value; and displaying the derived differential pressure conversion value and helium leak rate conversion value.