The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

May. 24, 2023
Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Yuichi Ito, Matsumoto, JP;

Mutsuo Nishikawa, Matsumoto, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/00 (2006.01); H10N 30/04 (2023.01);
U.S. Cl.
CPC ...
G01L 9/0054 (2013.01); H10N 30/04 (2023.02); G01L 2009/0066 (2013.01);
Abstract

Provided is a pressure detection device including: a semiconductor substrate having an upper surface; a bulk region of a first conductivity type provided in the semiconductor substrate; a piezo-resistive region of the first conductivity type provided between the bulk region and the upper surface of the semiconductor substrate; a first well region of a second conductivity type provided between the piezo-resistive region and the bulk region; and a first low-concentration region of the second conductivity type provided between the first well region and the bulk region and having a lower concentration than the first well region.


Find Patent Forward Citations

Ito, Yuichi. (2025). Pressure detection device and manufacturing method (U.S. Patent No. 12504340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12504340

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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