The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Feb. 28, 2024
Applicant:
Quality Vision International Inc., Rochester, NY (US);
Inventors:
Brian Deane, Rochester, NY (US);
Edward T. Polidor, Rochester, NY (US);
Will Smith, Marlborough, MA (US);
Assignee:
QUALITY VISION INTERNATIONAL INC., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); H04N 23/56 (2023.01); H04N 25/701 (2023.01);
U.S. Cl.
CPC ...
G01B 11/30 (2013.01); H04N 23/56 (2023.01); H04N 25/701 (2023.01);
Abstract
An apparatus for an optical based measurement machine for measuring a surface of a workpiece fixed to a rotational axis for rotation about the rotational axis, the apparatus comprising a probe configured for movement traverse to the rotational axis, the probe further configured to contact the surface of the workpiece in rotation about the rotational axis, an optical system imaging an illuminated profile of the probe, wherein the illuminated profile of the probe varies along the direction of the rotational axis.