The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
May. 10, 2021
Hitachi, Ltd., Tokyo, JP;
Masahiro Watanabe, Tokyo, JP;
Tatsuo Hariyama, Tokyo, JP;
Kenji Maruno, Tokyo, JP;
Shinya Hamagishi, Tokyo, JP;
Motoki Harayama, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control devicecontrols a movement mechanismto move a measurement probeto a target position of a target to be measured, calculates an error between an actual position of the measurement probedetected by the measurement probeand the target position, corrects the error by moving the measurement probeby the movement mechanismbased on the calculated error, and then causes the measurement probeto perform a distance measurement.