The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Nov. 04, 2021
Applicant:

Ultra Electronics Forensic Technology Inc., St-Laurent, CA;

Inventors:

Danny Roberge, St-Bruno, CA;

Alain Beauchamp, Montreal, CA;

Serge Levesque, Lachine, CA;

Assignee:

LEADSONLINE, LLC, Plano, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F42B 35/00 (2006.01); G01B 11/30 (2006.01); G06T 7/00 (2017.01); G06V 10/74 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
F42B 35/00 (2013.01); G01B 11/303 (2013.01); G06T 7/0004 (2013.01); G06V 10/761 (2022.01); G06V 20/64 (2022.01);
Abstract

There are described methods and system for determining a similarity or distance measure between a first ballistic specimen and a second ballistic specimen. The method comprises acquiring topographic data from the first ballistic specimen and the second ballistic specimen of at least one region of interest; computing from the topographic data at least one similarity score s for the first ballistic specimen and the second ballistic specimen; determining a non-match probability measure of the similarity score for at least one parameter characterizing a macroscopic and/or microscopic feature of the topographic data, the non-match probability measure associating the first ballistic specimen and the second ballistic specimen to a different source; and correcting the similarity score by determining a corrected similarity score that yields a same value of the non-match probability measure as the similarity score for a reference value of the at least one parameter.


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