The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Mar. 25, 2022
Applicant:

Schott Ag, Mainz, DE;

Inventors:

Tanja Woywod, Mainz, DE;

Eveline Rudigier-Voigt, Mainz, DE;

Jovana Djordjevic-Reiß, Mainz, DE;

Uwe Rothhaar, Birkenheide, DE;

Michaela Klause, Mainz, DE;

Sylvia Biedenbender, Bingen, DE;

Hartmut Bauch, Mommenheim, DE;

Assignee:

Schott AG, Mainz, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03C 17/09 (2006.01);
U.S. Cl.
CPC ...
C03C 17/09 (2013.01); C03C 2217/252 (2013.01); C03C 2217/78 (2013.01); C03C 2218/153 (2013.01); C03C 2218/31 (2013.01); C03C 2218/32 (2013.01);
Abstract

A coated glass element includes: a glass surface and a coating that coats at least part of the glass surface. The coating has at least one layer. The at least one layer of the coating fulfills the following parameter: [Al]/[Al]≥1.8. [Al]are counts of [Al] ions, measured by a time-of-flight secondary ion mass spectrometry (TOF-SIMS), at 20% of a time a sputter gun beam needs to reach the glass surface and [Al]are counts of [Al] ions, measured by a TOF-SIMS, at 80% of a time a sputter gun beam needs to reach the glass surface.


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