The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Mar. 31, 2025
Applicant:

Visionnav Robotics Usa Inc., Acworth, GA (US);

Inventors:

Tingwei Wu, Acworth, GA (US);

Bingchuan Yang, Acworth, GA (US);

Yongxian Zeng, Acworth, GA (US);

Assignee:

VisionNav Robotics USA Inc., Acworth, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B66F 9/075 (2006.01); B66F 9/06 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
B66F 9/0755 (2013.01); B66F 9/063 (2013.01); G01S 13/89 (2013.01);
Abstract

A method for determining an alignment state includes: acquiring, by using a sensor, target point clouds of a first and second stacking object; extracting, from the target point clouds, a first point cloud of a first target region of the first stacking object and a second point cloud of a second target region of the second stacking object; matching the first point cloud with a first template point cloud, to obtain a pose of the first stacking object, and matching the second point cloud with a second template point cloud, to obtain a pose of the second stacking object; and determining a difference between the poses of the first and second stacking object, and comparing the difference with a threshold, to determine an alignment state between the first and second stacking object. The present disclosure is used to implement alignment between a first and second stacking object during stacking.


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