The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

May. 30, 2024
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Tomohiro Murai, Tokyo, JP;

Takaaki Hashino, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64F 5/60 (2017.01); B29C 65/00 (2006.01); B64F 5/40 (2017.01); G01N 19/04 (2006.01);
U.S. Cl.
CPC ...
B64F 5/60 (2017.01); B29C 66/90 (2013.01); B64F 5/40 (2017.01); G01N 19/04 (2013.01);
Abstract

An inspection device includes a base facing, in a first direction, a surface to be inspected, a contact section mounted on the base and configured to contact with a seal on the surface, a biasing device mounted on the base and configured to bias the contact section in a second direction, and a reciprocating mechanism at an end portion of the base on the one side and configured to move the base in the second direction. The biasing device includes a rotary shaft extending in a third direction, an arm being rotatable about the rotary shaft, extending at both sides in the second direction with respect to the rotary shaft, and included with the contact section at an end portion on the one side, and a biasing member at an end portion of the arm on the other side and configured to move the contact section in the second direction.


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