The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jan. 31, 2023
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Bernhard Wiedemann, Rottenburg, DE;
Dominik Schmid, Aalen, DE;
Marius Haeusele, Aalen, DE;
Heiko Degen, Aalen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for additively manufacturing a workpiece having lateral workpiece dimensions includes obtaining a first data set defining the workpiece in layers arranged on top of the other. The method includes providing a manufacturing platform having lateral platform dimensions that are greater than the lateral workpiece dimensions. The method includes providing a structuring tool movable relative to the manufacturing platform. The method includes selecting an individual manufacturing region on the manufacturing platform. The method includes obtaining a second data set that represents individual layer deformations that are dependent on the selected manufacturing region. The method includes producing a defined material layer of the workpiece in the manufacturing region by controlling the structuring tool using the first and second data sets. The method includes repeating the producing in order to produce further defined material layers one on top of the other using the first data set and the second data set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile