The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jul. 22, 2021
Applicant:
Addup, Cebazat, FR;
Inventors:
Assignee:
ADDUP, Cebazat, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 12/90 (2021.01); B22F 10/28 (2021.01); B22F 10/80 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B22F 12/90 (2021.01); B22F 10/28 (2021.01); B22F 10/80 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12);
Abstract
A method for detecting defects in a layer of additive manufacturing powder deposited on a work zone, comprises the steps of: i. acquiring an image of a layer of additive manufacturing powder, ii. determining a discrete spectral representation of the image acquired, iii. filtering the discrete spectral representation of the image acquired in frequency terms, iv. determining a filtered image from the filtered discrete spectral representation of the image acquired, and v. analyzing the filtered image so as to detect defects.