The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jul. 05, 2021
Renishaw Plc, Wotton-under-Edge, GB;
David Roberts Mcmurtry, Dursley, GB;
John Dardis, Minchinhampton, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A method and apparatus for determining an alignment of an optical scanner for directing an electromagnetic beam to locations within a scan field. The method may include locating a reference element within the scan field of the optical scanner and controlling the optical scanner to cause the electromagnetic beam to be directed to a plurality of different points in the scan field, including at least one point on the reference element. Reflected electromagnetic radiation is detected. The method may include determining when the electromagnetic beam is directed to a reference position in the scan field given by the reference element from a comparison of an intensity of the detected electromagnetic radiation for the different points and determining a corresponding demand signal that causes the optical scanner to direct the electromagnetic beam to the reference position.