The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Sep. 29, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Kyeongin Jeong, Allen, TX (US);
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Methods and apparatuses for measurement and cell reselection in NTN. A method of operating a UE comprises: determining, based on a first threshold and a second threshold, whether a first condition is satisfied; determining, based on a third threshold, whether a second condition is satisfied; and skipping measurement operations on neighboring cells in a NTN based on a determination that the first condition and the second condition are satisfied, wherein: the first condition corresponds to a cell selection receive (RX) level value (Srxlev) being greater than the first threshold and a cell selection quality value (Squal) being greater than the second threshold, respectively, and the second condition corresponds to a distance between a UE location and a serving cell reference point being less than the third threshold.