The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Dec. 02, 2022
Duke University, Durham, NC (US);
Xiang Dai, Durham, NC (US);
Roarke Horstmeyer, Durham, NC (US);
Shiqi Xu, Durham, NC (US);
Pavan Chandra Konda, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A microscopy system includes a lens, an image sensor, a planar array of light sources, and a first and second polarizing filter. The lens is disposed between the array and the image sensor. The image sensor has a field of view and is positioned to capture an image of a sample in a target area. Each light source provides light from a different direction to the target area. The first polarizing filter and the second polarizing filter are each positioned at a rotation angle. A method of microscopy imaging includes illuminating a sample positioned in a target area of a lens with a light source from an array of light sources, acquiring a set of images by an image sensor of the illuminated sample, and performing a reconstruction algorithm on the set of images to generate a composite high-resolution image over the field of view of the image sensor.