The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Jul. 22, 2025
Applicant:

Peltbeam Inc., Sherman Oaks, CA (US);

Inventors:

Ahmadreza Rofougaran, Newport Beach, CA (US);

Mehdi Hatamian, Mission Viejo, CA (US);

Shervin Alireza Odabaee, Newport Coast, CA (US);

Arman Rofougaran, Newport Coast, CA (US);

Milan Rofougaran, Newport Coast, CA (US);

Kavian Odabaee, Newport Coast, CA (US);

Assignee:

PELTBEAM INC., Sherman Oaks, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/00 (2006.01); H04B 7/155 (2006.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
H04B 1/0007 (2013.01); H04B 7/15585 (2013.01); H04W 84/18 (2013.01);
Abstract

A wireless communication system includes a central cloud server that causes a plurality of hybrid analog-digital repeater devices to extract a reference signal independently from a first type of polarization and a second type of polarization at each of the plurality of hybrid analog-digital repeater devices, monitors, over time, a signal metric of the extracted reference signal at a plurality of different locations for the plurality of hybrid analog-digital repeater devices, detects an interferer in a specific area across a wireless backhaul mesh network in a case where the signal metric of the extracted reference signal is dropped beyond a defined threshold at a given location of the plurality of different locations, estimates a location of the interferer based on the detected interferer in the specific area, and analyzes the estimated location of the interferer and previous movement patterns of the interferer to predict a future trajectory of the interferer.


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