The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jan. 29, 2024
Nxp B.v., Eindhoven, NL;
Ashish Goel, Noida, IN;
Ajay Sharma, New Delhi, IN;
Ruchi Bora, Lucknow, IN;
Umesh Pratap Singh, Hodal, IN;
NXP B.V., Eindhoven, NL;
Abstract
A validation circuit is placed in vicinity of a critical path for testing the critical path. The validation circuit receives test data from the control circuit for testing the critical path. The test data is indicative of a delay value that is associated with the critical path. The validation circuit generates multiple setup signals and an enable signal to facilitate the testing of the critical path based on the test data. The validation circuit generates a first test signal based on the enable signal, and a second test signal based on the first test signal and the setup signals. The second test signal is a delayed version of the first test signal. The validation circuit compares the first test signal and the second test signal. A mismatch between the first test signal and the second test signal indicates deviation from the delay value.