Memory device for performing bad block check, method of operating memory device, and method of operating storage controller communicating with memory device

Abstract

Provided herein may be a memory device for performing a bad block check, a method of operating the memory device, and a method of operating a storage controller communicating with the memory device. The memory device may include a first area including a first memory cell, a second area including a second memory cell, the first memory cell and the second memory cell coupled to an identical word line, and a control circuit configured to perform a first operation on the first area and a second operation on the second area and configured to store a first result indicating whether the first operation has succeeded and a second result indicating whether the second operation has succeeded.