Variable foggy verify levels for selected checkpoint states for non-volatile memory apparatuses

Abstract

A memory apparatus includes memory cells and a control means configured to adjust at least one of blind program pulses applied to word lines connected to the memory cells and bit line voltages applied to bit lines coupled to the memory cells in response to determining one of the word lines connected to the memory cells being programmed is susceptible to over-programming. The control means programs non-checkpoint ones of the memory cells associated with a checkpoint state to a verify low voltage for the checkpoint state and programs the non-checkpoint ones of the memory cells to respective non-checkpoint states associated with the checkpoint state by applying the blind program pulses to each non-checkpoint one of the memory cells without verifying whether the non-checkpoint ones of the memory cells have reached their respective non-checkpoint states while applying the bit line voltages to the bit lines associated therewith.