The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Mar. 01, 2023
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ziwei Deng, Tokyo, JP;

Naoto Akira, Tokyo, JP;

Tomoaki Yoshinaga, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/22 (2022.01); G06V 10/26 (2022.01); G06V 10/77 (2022.01); G06V 10/776 (2022.01); G06V 10/778 (2022.01); G06V 10/94 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7788 (2022.01); G06V 10/225 (2022.01); G06V 10/26 (2022.01); G06V 10/7715 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 10/945 (2022.01);
Abstract

An area extraction method includes acquiring a captured image, generating a feature map using the captured image, extracting a candidate bounding box indicating an area in which an object exists in the captured image using the feature map, a segmentation step of generating a mask that is a bounding box indicating the area in which the object exists using the feature map and the candidate bounding box, acquiring input information which is input by a user regarding the object in the captured image, extracting the candidate bounding box using the feature map and the input information, and updating the feature map using the candidate bounding box extracted in the area estimation step and the input information. Wherein the candidate bounding box can be extracted further using the mask generated in the segmentation step, and the feature map can be updated using the mask generated in the segmentation step.


Find Patent Forward Citations

Loading…