The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Aug. 15, 2023
Applicant:

Hitachi Kokusai Electric Inc, Tokyo, JP;

Inventor:

Keigo Hasegawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/778 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06V 10/778 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
Abstract

An image analysis system and update method for a machine-learning model are to update a model in operationto a retrained model, wherein in an image analysis serverwhich analyzes shot images, a first inference unitperforms inference using the trained model in operation, a relearning unitperforms relearning to generate a retrained model, a second inference unitperforms inference using a retrained model, and a comparison unitcompares the execution results of the first inference unitand the second inference unitto determine whether or not to update the model in operationto the retrained model


Find Patent Forward Citations

Hasegawa, Keigo. (2025). Image analysis system an update method for machine learning model (U.S. Patent No. 12499668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12499668

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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